Advantages And Disadvantages Of The Electron Microscope

Table of Contents

Benefits

Potential drawbacks

Different types of electron microscopy

Transmission electron microscope (TEM).

An electron microscope that uses scanning technology is the scanning electron microscope (SEM).

An electron detector detects the electron beam and uses it to see electrons in microscopes. An electron beam can help you see the very tiny areas of the specimen. But, unlike visible light, its wavelength is much shorter than electron beam. This allows you the ability to see details as small as nanometers.

History:

Hans Busch was 1931’s first scientist to discover the electromagnetic lenses.

Max Knoll and Ernst Ruska built the proto-electron microscope in 1931. It has four-hundred-power magnification.

Ruska created an electron microscope in 1933 that was more precise than an optical microscope. Reinhold Rudenberg and Siemens-Schuckertwerke both partner introduced the electron microscope in May 1931.

Principle:The electron microscope’s principle is very similar to the bright microscope. It is very different from the bright microscope. The user uses the microscope and visible light source. The latter uses electromagnetic lenses and electron beam. The electrons may collide with the air molecules, causing them to get deflected. This can hinder the formation of images. The microscope is protected by an ultra-high vacuum.

The first benefit is the high magnification. An electron microscope is useful in many industrial and technological areas, including semiconductor inspection, computer chip manufacture, quality control, and production lines.

There are some disadvantages. They can be expensive and require a lot of space. They are sensitive to external magnetic fields and vibrations. They need stable voltage supplies, currents that can be used to generate electromagnetic lenses, and cool water circulation so that samples don’t get damaged by heat emitted during the process of energizing electrons. These are essential in high-end research facilities.

There are three types of electron microscopy

Scanning Electron Microscope (SEM)

Transmission Electron Microscope

The Transmission electron microscope, (TEM)The transmission electron microscope is the first ever electron microscope. TEM uses thin slices of sample to shoot electron beams at them. The electrons then are detected from the other side. TEM allows you to see a very thin slice of a sample in high resolution. It’s useful in studying the structure and components of cells.

The scanning electron microscopy (SEM) allows for high resolution viewing of the surfaces of three-dimensional items. The electron beam scans the object’s surface and detects the electrons that are reflected back. SEM can create three-dimensional images from lice, flies, or other objects.